Figure 3.

DLTS results in macroscopic Schottky junctions. a. DLTS frequency scan spectra measured by DLS-83D system. b. Depth profile of the defect. c. Arrhenius plot for determination of the activation energy of the defect.

D√≥zsa et al. Nanoscale Research Letters 2011 6:140   doi:10.1186/1556-276X-6-140
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