SpringerOpen Newsletter

Receive periodic news and updates relating to SpringerOpen.

Open Access Email this article to a friend

Scanning tip measurement for identification of point defects

László Dózsa*, György Molnár, Vito Raineri, Filippo Giannazzo, János Ferencz and Štefan Lányi

Nanoscale Research Letters 2011, 6:140  doi:10.1186/1556-276X-6-140

Fields marked * are required


Multiple email addresses should be separated with commas or semicolons.
How can I ensure that I receive Nanoscale Research Letters's emails?