Figure 2.

a Transmission electron microscopy (TEM) image of thin FePt layer on columnar CrV seed layer. b XRD pattern of the as-grown film stack. c Scanning electron microscopy (SEM) images of FePt patterns of 100 nm diameter (left) and 50 nm diameter (right), respectively. Insets show magnified views of the respective patterns for clarity.

Kim et al. Nanoscale Res Lett 2011 6:13   doi:10.1007/s11671-010-9755-2