XRD patterns. XRD patterns measured by synchrotron radiation for reflections of MnAs in the specular geometry, and (0002) in the grazing incidence geometry for samples A (black), B (blue), C (wine), and D (red). The radial scan along MnAs (0002) of sample C can be fitted well by two peaks centered at 31.44 and 31.61 which can be ascribed to MnAs (0002) and GaAs (002), respectively (d).
Xu et al. Nanoscale Research Letters 2011 6:125 doi:10.1186/1556-276X-6-125