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Nanoscale characterization of electrical transport at metal/3C-SiC interfaces

Jens Eriksson*, Fabrizio Roccaforte, Sergey Reshanov, Stefano Leone, Filippo Giannazzo, Raffaella LoNigro, Patrick Fiorenza and Vito Raineri

Nanoscale Research Letters 2011, 6:120  doi:10.1186/1556-276X-6-120

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