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Scanning Probe Microscopy on heterogeneous CaCu3Ti4O12 thin films

Patrick Fiorenza*, Raffaella Lo Nigro and Vito Raineri

Author Affiliations

Istituto per la Microelettronica e Microsistemi (IMM), Consiglio Nazionale delle Ricerche, Strada VIII, 5; 95121 Catania, Italy

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Nanoscale Research Letters 2011, 6:118  doi:10.1186/1556-276X-6-118

Published: 4 February 2011


The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu3Ti4O12 (CCTO) thin films deposited by MOCVD on IrO2 bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular features in terms of conductive and insulating regions. The microstructure and the dielectric properties of CCTO thin films have been studied and the evidence of internal barriers in CCTO thin films has been provided. The role of internal barriers and the possible explanation for the extrinsic origin of the giant dielectric response in CCTO has been evaluated.