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Resolution: standard / high Figure 4.
SEM observation of NW sidewalls for (a1) a <111>-oriented Si NWs and (b1) a <110>-oriented
Ge NWs grown on a Si(111) surface by MBE. Some sidewall orientations are indicated for both types of NWs. Lattice-resolved
TEM images showing the roughness of (a2) a {112} sidewall on a <111>-oriented Si NWs and (b2) a {111} sidewall on a <110>-oriented Ge NWs.
Xu et al. Nanoscale Research Letters 2011 6:113 doi:10.1186/1556-276X-6-113 |