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Conductive-probe atomic force microscopy characterization of silicon nanowire

José Alvarez*, Irène Ngo, Marie-Estelle Gueunier-Farret, Jean-Paul Kleider, Linwei Yu, Pere Rocai Cabarrocas, Simon Perraud, Emmanuelle Rouvière, Caroline Celle, Céline Mouchet and Jean-Pierre Simonato

Nanoscale Research Letters 2011, 6:110  doi:10.1186/1556-276X-6-110

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