Evaluation of the effective area from local capacitance measurements. Local capacitance-voltage curves measured on fixed positions on bare SiO2 (a) and on graphene-coated SiO2 (b) for a sample not subjected to ion irradiation. AFM morphology of a graphene flake on SiO2, with indicated the probed positions by the SCS tip. (inset of a). Effective area evaluated from the C-V curves in (a) and (b). Schematic representation of Atip and Aeff (inset of c).
Giannazzo et al. Nanoscale Research Letters 2011 6:109 doi:10.1186/1556-276X-6-109