SpringerOpen Newsletter

Receive periodic news and updates relating to SpringerOpen.

Open Access Editorial

Advanced materials nanocharacterization

Filippo Giannazzo1*, Pierre Eyben2, Jacek Baranowski3, Jean Camassel4 and Stefan Lányi5

Author affiliations

1 CNR-IMM, Strada VIII, 5, 95121 Catania, Italy

2 Imec Kapeldreft, 75 3001 Leuven, Belgium

3 Institute of experimental Physics, ul. Hoża 69 Warsaw 00-681, Poland

4 Groupe d'Etude des Semiconducteurs, Université Montpellier 2, 34095 Montpellier Cedex 5, France

5 Institute of Physics, SAS Dúbravská cesta 9 845 11 Bratislava, Slovakia

For all author emails, please log on.

Citation and License

Nanoscale Research Letters 2011, 6:107  doi:10.1186/1556-276X-6-107

Published: 31 January 2011

Abstract

This special issue of Nanoscale Research Letters contains scientific contributions presented at the Symposium D "Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors" of the E-MRS Fall Meeting 2010, which was held in Warsaw, Poland from 13th to 17th September, 2010.