Figure 1.

X-ray and AFM of the Al thin film. (a) The φ scanning of Al(111) peak of the sample. (b) An AFM 5 × 5-μm2 image of a 60-nm-thick Al thin film.

Lo et al. Nanoscale Research Letters 2011 6:102   doi:10.1186/1556-276X-6-102
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