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Resolution: standard / high Figure 1.
X-ray and AFM of the Al thin film. (a) The φ scanning of Al(111) peak of the sample. (b) An AFM 5 × 5-μm2 image of a 60-nm-thick Al thin film.
Lo et al. Nanoscale Research Letters 2011 6:102 doi:10.1186/1556-276X-6-102 |
