Figure 3.

TEM Micrograph of a Si/SiO2nanoflake, with maximum axis >300 nm, showing the coral-like structure and the encapsulated Si nanodots. Inserts shows the electron diffraction pattern (left bottom), and a magnified image of the Si nanodots structure (A)

Amato Nanoscale Research Letters 2010 5:1156-1160   doi:10.1007/s11671-010-9619-9