Figure 1.

Atomic Force Microscope (operated in intermittent non-contact mode) image of a continuous indium film on quartz substrate b indium nanowires grown inside the trench template (shown in red coloured arrows) [up right inset in b shows the schematic diagram of the technique and down right inset shows the growth of nanowires in a trench], c residual indent impression of Indium nanowires (contrast of the image was improved using Microsoft Office Picture Manager software in order to show a clear indent impression on wire kind of structure), d the line profile of the indent, e Coloured 3-D image of indented impression

Kumar and N Kiran Nanoscale Research Letters 2010 5:1085-1092   doi:10.1007/s11671-010-9606-1