Figure 9.
Field-emission current (J) versus applied electric field (E) characteristics of thin-walled open-ended aligned N-doped CNTs grown at three different
temperatures and the inset is the corresponding Fowler–Nordheim plots of different
samples
Cui et al. Nanoscale Research Letters 2010 5:941 doi:10.1007/s11671-010-9586-1 |
