Figure 3.
HRTEM image of one randomly selected ZnSe/ZnSeTe superlattice nanotip with Lw = 20 nm. Insets at the bottom show FFT patterns measured from four different points
in this particular superlattice nanotip and low-magnification bright-field TEM image
Hsiao et al. Nanoscale Research Letters 2010 5:930 doi:10.1007/s11671-010-9584-3 |
