Figure 3.

HRTEM image of one randomly selected ZnSe/ZnSeTe superlattice nanotip with Lw = 20 nm. Insets at the bottom show FFT patterns measured from four different points in this particular superlattice nanotip and low-magnification bright-field TEM image

Hsiao et al. Nanoscale Research Letters 2010 5:930-934   doi:10.1007/s11671-010-9584-3