Figure 7.

AES depth profile of the oxide film on alloy C22 formed at −0.5 V (a), −0.1 V (b) and 0.26 V (c) in 0.1 and 1.0 M KOH

Cai and Gervasio Nanoscale Research Letters 2010 5:613-619   doi:10.1007/s11671-009-9521-5