Figure 2.

a Typical image of “black silicon” spot fabricated on a Si wafer by multi-pulse fs laser ablation in vacuum; b Typical scanning electron microscopy (SEM) image of penguin-like structure of black silicon; c Typical absorption spectra from “black silicon” and silicon treated by different methods

Kabashin et al. Nanoscale Research Letters 2010 5:454-463   doi:10.1007/s11671-010-9543-z