Figure 2.

a Bright-field TEM image observed at the interface between a ZnO NRA and a substrate. Note that existence of a continuous ZnO film of 150 nm in thickness on the Pt layer. b Selected area electron diffraction pattern taken from a region including the Pt layer, ZnO layer, and ZnO NRA. c High-resolution TEM lattice image taken at an interfacial area of the ZnO layer and Pt layer. d High-resolution TEM lattice image of individual ZnO nanorods

Park et al. Nanoscale Research Letters 2009 5:353-359   doi:10.1007/s11671-009-9487-3