Open Access Email this article to a friend

Defect Characterization in SiGe/SOI Epitaxial Semiconductors by Positron Annihilation

R Ferragut*, A Calloni, A Dupasquier and G Isella

Nanoscale Research Letters 2010, 5:1942-1947  doi:10.1007/s11671-010-9818-4

Fields marked * are required

Multiple email addresses should be separated with commas or semicolons.
How can I ensure that I receive Nanoscale Research Letters's emails?