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Open Access SPECIAL ISSUE ARTICLE

Defect Characterization in SiGe/SOI Epitaxial Semiconductors by Positron Annihilation

R Ferragut*, A Calloni, A Dupasquier and G Isella

Nanoscale Research Letters 2010, 5:1942-1947  doi:10.1007/s11671-010-9818-4

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