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In situ Control of Si/Ge Growth on Stripe-Patterned Substrates Using Reflection High-Energy Electron Diffraction and Scanning Tunneling Microscopy

B Sanduijav, DG Matei and G Springholz*

Nanoscale Research Letters 2010, 5:1935-1941  doi:10.1007/s11671-010-9814-8

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