Figure 2.
SEM a–b and AFM c–d images of the sample surface in the pit-patterned region after annealing at 625°C
for 7.5 min. The AFM image in c is shown in gradient mode
Vanacore et al. Nanoscale Research Letters 2010 5:1921 doi:10.1007/s11671-010-9781-0 |
