Table 1
Details of the investigated samples. xIn and R[hkl] were calculated from RSM peak data, and hQD and ρQD were determined for 1 μm × 1 μm and 10 μm × 10 μm AFM images, respectively 13. The major dislocation type was determined based on several 20 μm × 20 μm SEM pictures
Sample	Material	Strain	Tg (°C)	XIn	R[011] (%)	R[01-1] (%)	hQD (nm)	ρQD (cm−2)	Maj. Dislocation type
A	GaInAs	CS	520	0.142	1.60	1.40	13	5.0 × 109	α[0–11]
B	GaInP	CS	520	0.618	1.50	1.60	14	5.1 × 109	α[0–11]
C	GaInP	CS	430	0.617	1.70	1.60	13	5.6 × 109	β[011]
D	GaInP	TS	430	0.354	2.60	1.90	16	4.2 × 109	α[011]
E	GaInP	TS	430	0.34	0.00	0.00	No QDs	No QDs	No dislocations
F	GaInP	TS	430	–	–	–	No QDs	No QDs	β[0–11]

Hakkarainen et al. Nanoscale Research Letters 2010 5:1892   doi:10.1186/1556-276X-5-1892