Table 1

Details of the investigated samples. xIn and R[hkl] were calculated from RSM peak data, and hQD and ρQD were determined for 1 μm × 1 μm and 10 μm × 10 μm AFM images, respectively [13]. The major dislocation type was determined based on several 20 μm × 20 μm SEM pictures
Sample Material Strain Tg (°C) XIn R[011] (%) R[01-1] (%) hQD (nm) ρQD (cm−2) Maj. Dislocation type
A GaInAs CS 520 0.142 1.60 1.40 13 5.0 × 109 α[0–11]
B GaInP CS 520 0.618 1.50 1.60 14 5.1 × 109 α[0–11]
C GaInP CS 430 0.617 1.70 1.60 13 5.6 × 109 β[011]
D GaInP TS 430 0.354 2.60 1.90 16 4.2 × 109 α[011]
E GaInP TS 430 0.34 0.00 0.00 No QDs No QDs No dislocations
F GaInP TS 430 No QDs No QDs β[0–11]

Hakkarainen et al.

Hakkarainen et al. Nanoscale Research Letters 2010 5:1892-1896   doi:10.1007/s11671-010-9747-2

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