Figure 3.

Cls core-level spectra of SiC thin film on Si, after annealing at (i) 1,273 K (sample B), (ii) 1,423 K (Sample C), (iii) 1,523 K (sample D) annealing, respectively

Abe et al. Nanoscale Research Letters 2010 5:1888-1891   doi:10.1007/s11671-010-9731-x