Figure 1.

a and b 3 × 3 μm AFM micrographs measured on uncapped samples (6 ML at TGe = 690°C) grown on a e-beam patterned Si(001) (pit-period = 400 nm) and b on planar Si(001). The color scale depicts the local surface slope with respect to (001). c PL spectra (Pexc = 2.6 W/cm2) of capped islands (6 ML at TGe = 700°C) grown on holographically patterned Si(001) (red) and planar Si(001) (black) substrates. A clear splitting of the NP peak and the TO replica is observed in the PL of ordered islands

Brehm et al. Nanoscale Research Letters 2010 5:1868-1872   doi:10.1007/s11671-010-9713-z