Table 1

Critical lateral forces and values of μ determined from nanoscratch trace depths within GaN films on c- and a-axis sapphire substrates
Sample Normal load (µN) Coefficient of friction Lateral force (µN)
GaN C-plane 2,000 0.105 −91.3
GaN C-plane 4,000 0.105 −200.2
GaN A-plane 2,000 0.096 −100.6
GaN A-plane 4,000 0.188 −256.2

Lin et al.

Lin et al. Nanoscale Research Letters 2010 5:1812-1816   doi:10.1007/s11671-010-9717-8

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