Open Access NANO EXPRESS

Nanoscratch Characterization of GaN Epilayers on c- and a-Axis Sapphire Substrates

Meng-Hung Lin, Hua-Chiang Wen*, Yeau-Ren Jeng and Chang-Pin Chou

Nanoscale Research Letters 2010, 5:1812-1816  doi:10.1007/s11671-010-9717-8

Article Metrics

1474
Total accesses

Article metric FAQ

Accesses  

  • Last 30 days: 58 accesses
  • Last 365 days: 421 accesses
  • All time: 1474 accesses

These numbers are accesses on SpringerOpen websites only, and an underestimate of total usage. More information