Figure 8.

a AFM topographical image from a Cu nanosized thin film deposited on Si and filtered in 20 nm, b Particle size histogram obtained from the height of the NPs, c Larger magnification of the film from (a), dZ-Height profile along the line indicated in (c), height (19.1 nm). Experimental conditions: Ar (25 sccm), He (2.2 sccm), Agg. Length (100 mm), Power (60 W)

Gracia-Pinilla et al. Nanoscale Research Letters 2009 5:180-188   doi:10.1007/s11671-009-9462-z