Figure 6.

a AFM topographical image from Cu nanoparticles deposited on Si and filtered in 2 nm, b Larger magnification of the Cu NPs, cZ-Height profile along the line indicated in (b), height (2.4 nm). Experimental conditions: Ar (20.9 sccm), He (10.9 sccm), Agg. Length (103 mm), Power (60 W)

Gracia-Pinilla et al. Nanoscale Research Letters 2009 5:180-188   doi:10.1007/s11671-009-9462-z