Figure 3.

a, c TEM micrographs of annealed samples S3 and S4. The inset is the image of the product with high magnification image. b, d The corresponding size distribution histograms of S3 and S4. e The magnification image of S4 and the in suit SAED pattern (f)

Wu et al. Nanoscale Research Letters 2009 5:116-123   doi:10.1007/s11671-009-9452-1