Figure 3.

X-ray diffraction (θ–2θ scan) patterns of the FePt samples annealed at (a) 500, (b) 600, (c) 700, and (d) 750 °C for 60 min in vacuum

Gao et al. Nanoscale Research Letters 2009 5:1-6   doi:10.1007/s11671-009-9433-4