Figure 2.

TEM image of the monolayer FePt nanoparticle array covered by a SiO2 overlayer after 700 °C annealing for 60 min, and the corresponding electron diffraction pattern is shown as inset

Gao et al. Nanoscale Research Letters 2009 5:1-6   doi:10.1007/s11671-009-9433-4