Figure 3.

aAverage Ge content,xGe, for islands marked in Fig. 1a, as a function ofzlevel with respect to the Si substrate (z= 0 nm).bAverage Ge content of the islands as a function of their height.xGeerror bars are of about 0.02

Pezzoli et al. Nanoscale Research Letters 2009 4:1073-1077   doi:10.1007/s11671-009-9360-4