Figure 1.

(Color online)a30 μm × 30 μm AFM scan of the sample surface close to a corner of the patterned area. Thegrayscale corresponds to the local surface slope with respect to the (001) plane. The analyzed areas on planar and patterned surface are marked inblueandred, respectively.bHeight distribution of islands grown on pit-pattern (red bars) and flat surface (blue).c,dIsland aspect ratio versus volume for islands in the regions marked ina. Indthe island volumes have been rescaled according toxGe6and (0.87 × xGe)6for (filled square) and (open circle), respectively

Pezzoli et al. Nanoscale Research Letters 2009 4:1073-1077   doi:10.1007/s11671-009-9360-4