Alloying and Strain Relaxation in SiGe Islands Grown on Pit-Patterned Si(001) Substrates Probed by Nanotomography

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F Pezzoli^*, M Stoffel, T Merdzhanova, A Rastelli and OG Schmidt

Nanoscale Research Letters 2009, 4:1073-1077 doi:10.1007/s11671-009-9360-4

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