Figure 1.
aXRD pattern of the MnO2thin film synthesized at RT,bXRD pattern of the MnO2thin film synthesized at 80 °C (Thedotted linesinredcolor represent the diffraction peaks from Mn3O4), andcphotos of the Pt substrate before and after the deposition
Xia et al. Nanoscale Research Letters 2009 4:1035 doi:10.1007/s11671-009-9352-4 |
