SungWook Mhin, JeongHo Ryu*, KangMin Kim, GyeongSeon Park, HanWool Ryu, KwangBo Shim, Takeshi Sasaki and Naoto Koshizaki
* Corresponding author: JeongHo Ryu jimihen.ryu@samsung.com
Nanoscale Research Letters 2009, 4:888-895 doi:10.1007/s11671-009-9331-9