Figure 3.
a,bLow-magnification TEM images of SiC–W18O49double-layer nanostructures showing W18O49and SiC separately;chigh angle annular dark field (HAADF) STEM image of SiC nanowires with some particles;
and corresponding EELS elemental mapping ofdSi,eW, andfO, respectively
Kim et al. Nanoscale Research Letters 2009 4:802 doi:10.1007/s11671-009-9318-6 |
