Figure 3.

Representative surface roughness power spectra for the analyzed sample calculated by the AFM images reported in Fig. 1:afor the sample with a thickness of 2 nmbof 8 nm,cof 14 nm,dof 20 nm,eof 26 nm,fof 32 nm of Au respectively. The continuous lines represent the fit by Eq. 4. The values ofγireported as insets are calculated by such fits

Ruffino et al. Nanoscale Research Letters 2009 4:262-268   doi:10.1007/s11671-008-9235-0