Figure 2.

aXTEM showing a periodic IMF array with a periodicity of 5.6 nm, asdark spots, at the GaSb/GaAs interfacebSAED double diffraction pattern of IMF growth mode, andcXTEM of non-IMF growth mode with high threading dislocation density compared to the IMF growth mode

Jallipalli et al. Nanoscale Research Letters 2009 4:1458-1462   doi:10.1007/s11671-009-9420-9