Open Access Nano Express

Preparation and Characterization of Covalently Binding of Rat Anti-human IgG Monolayer on Thiol-Modified Gold Surface

Zhengjian Lv, Jianhua Wang*, Linhong Deng and Guoping Chen

Author Affiliations

Key Laboratory of Biorheological Science and Technology, Ministry of Education, and Institute of Biochemistry and Biophysics, College of Bioengineering, Chongqing University, 400044, Chongqing, China

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Nanoscale Research Letters 2009, 4:1403-1408  doi:10.1007/s11671-009-9412-9

Published: 16 September 2009


The 16-mercaptohexadecanoic acid (MHA) film and rat anti-human IgG protein monolayer were fabricated on gold substrates using self-assembled monolayer (SAM) method. The surface properties of the bare gold substrate, the MHA film and the protein monolayer were characterized by contact angle measurements, atomic force microscopy (AFM), grazing incidence X-ray diffraction (GIXRD) method and X-ray photoelectron spectroscopy, respectively. The contact angles of the MHA film and the protein monolayer were 18° and 12°, respectively, all being hydrophilic. AFM images show dissimilar topographic nanostructures between different surfaces, and the thickness of the MHA film and the protein monolayer was estimated to be 1.51 and 5.53 nm, respectively. The GIXRD 2θ degrees of the MHA film and the protein monolayer ranged from 0° to 15°, significantly smaller than that of the bare gold surface, but the MHA film and the protein monolayer displayed very different profiles and distributions of their diffraction peaks. Moreover, the spectra of binding energy measured from these different surfaces could be well fitted with either Au4f, S2p or N1s, respectively. Taken together, these results indicate that MHA film and protein monolayer were successfully formed with homogeneous surfaces, and thus demonstrate that the SAM method is a reliable technique for fabricating protein monolayer.

Rat anti-human IgG; Self-assembled monolayer; Covalent binding; Contact angle; Atomic force microscopy; Grazing incidence X-ray diffraction; X-ray photoelectron spectroscopy