Figure 1.

XRD pattern of rice-like HfO2nanostructures obtained by MH at 140 °C for 1 h. The vertical lines indicate the position and relative intensity of JCPDS card no. 35-0104

Eliziário et al. Nanoscale Research Letters 2009 4:1371-1379   doi:10.1007/s11671-009-9407-6