Figure 1.

aCross section of the sample obtained from four-layered deposition on the FTO conducting glass measured by SEM.bAFM image of the NBT thin films annealed at 750 °C.cSchematic diagram ofI–Vmeasurement system

Zhang et al. Nanoscale Research Letters 2009 4:1309-1314   doi:10.1007/s11671-009-9397-4