Diffracted intensity profile (cyan shadow) taken from the inset of Fig. 1a showing a maximum intensity around the axis (0 nm-1) before background subtraction to reveal a low-angle scattering bump in the profile (green) as the case in Fig. 1d.
Huang et al. Nanoscale Research Letters 2009 4:1286-1296 doi:10.1007/s11671-009-9394-7