Figure 4.

IrMn thickness (x) dependence of the exchange-biasing field (Hex) for the glass/Ta(30 Å)/NiFe(50 Å)/IrMn(x Å)/Ta(100 Å) samples under conditions (a) to (c)

Chen Nanoscale Research Letters 2008 4:90-93   doi:10.1007/s11671-008-9207-4