Figure 2.
Atomic force microscopy scan results for PSZT thin film deposited at 700 °C:athree-dimensional representation of film surface showing facetted tightly packed grains,btopography image obtained over an area of 1 × 1 μm2, andcthe deflection image corresponding to the topography in (b)
Sriram et al. Nanoscale Research Letters 2008 4:29 doi:10.1007/s11671-008-9197-2 |
