Figure 1.

X-ray diffractograms obtained for PSZT thin films:adeposited at room temperature with subsequent furnace annealing at 700 °C for 3 h andbdeposited at a substrate temperature of 700 °C for 3 h

Sriram et al. Nanoscale Research Letters 2008 4:29-33   doi:10.1007/s11671-008-9197-2