Figure 1.
X-ray diffractograms obtained for PSZT thin films:adeposited at room temperature with subsequent furnace annealing at 700 °C for 3 h
andbdeposited at a substrate temperature of 700 °C for 3 h
Sriram et al. Nanoscale Research Letters 2008 4:29 doi:10.1007/s11671-008-9197-2 |
