Figure 1.

SEM micrographs of (a) mechanically polished Si, (b) electrochemically etched (porous) Si, (c) as-deposited Fe film, (d) as-deposited patterned Fe film, and (e) NH3 plasma-treated Fe film

Srivastava et al. Nanoscale Research Letters 2008 3:205-212   doi:10.1007/s11671-008-9138-0